Waferpedia

LTX-Credence

PE 3000

Test & ProbeLTX-Credence PE 3000 family
Research Quality: 40% complete

Provisional entry — research in progress

This page was generated automatically from cited public sources and hasn't completed the full research pass yet. Every specification shown carries its source; more detail is added as research completes.

The LTX-Credence PE 3000 is a tester for integrated circuit process manufacturing. The LTX-Credence PE 3000 is categorized as Test & Probe.[1][2]

LTX-CredencePE 3000
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What it is

The LTX-Credence PE 3000 is a tester for integrated circuit process manufacturing.[3][1][2]

How it works

General reference — not yet source-verified

Test and probe equipment brings probe needles or probe cards into contact with device pads on a wafer so electrical measurements can be taken before the wafers proceed to later fabrication steps.

A tester in this class applies measurement and stimulus signals through the probing interface and records the device response for process and device evaluation.

Where it fits in the process flow

The PE 3000 fits in wafer-level electrical test within integrated circuit process manufacturing.[3][1][2]

Applications

The PE 3000 is used for integrated circuit process manufacturing.[3][1][2]

What do the numbers mean?

Configuration & options5

for integrated circuit process manufacturing[3]
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Manufacturer
LTX-Credence[1]
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Category
Test & Probe[1]
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Tool type
tester[1]
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Application
integrated circuit process manufacturing[1]
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Where are the manuals?

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Not publicly documented

Field notes

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Frequently asked questions

What is the LTX-Credence PE 3000?

The LTX-Credence PE 3000 is a tester for integrated circuit process manufacturing.[3][1][2]

What equipment category does the PE 3000 belong to?

The PE 3000 is in the test and probe category.[1]

What manufacturing context is given for the PE 3000?

The PE 3000 is used for integrated circuit process manufacturing.[3][1][2]

Not publicly documented

The following facts about the PE 3000 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.

  • No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the PE 3000 are on record.

    Answerable by: OEM historical records or a trade-press announcement

  • No publicly documented variants, configuration options, or revision breakpoints of the PE 3000 are on record.

    Answerable by: an OEM product catalog or an engineer who ordered or specified the tool

  • The control-system platform and OS era of the PE 3000 are not on record.

    Answerable by: an engineer who operated it or OEM installation records

  • No publicly documented failure modes or field errata for the PE 3000 are on record.

    Answerable by: a field service engineer, process engineer, or maintenance technician

  • The process node or technology generation of the PE 3000 is not on record.

    Answerable by: an OEM datasheet or a fab qualification report

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Sources & citations

Sources (3)Every fact above is drawn from these public sources
  1. [1]waferpedia.com — waferpedia.comwaferpedia.com
  2. [2]LTX-Credence PE 3000 family | Waferpedia — waferpedia.comwaferpedia.com
  3. [3]inventory listing
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Last updated Oct 5, 2026.

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