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39 entries
The LTX-Credence TS 88 is a semiconductor testing machine described as an automated inspection and testing device for post-manufacturing use.
The LTX / Credence D 10 is a tester used in semiconductor manufacturing.
The LTX / Credence Fusion MX is a tester system manufactured by LTX/Credence.
The LTX-Credence TS 80 Integrated Circuit Parameter Analyzer is a parameter analyzer for integrated circuits.
The LTX-Credence Kalos XW Memory is a memory tester.
The LTX / Credence Diamond 10 Tester is a semiconductor test system with software version 2.1.1.4 and a modular configuration including DD1096_32, DPS16, VIS16, and MULTIWAVE modules.
The LTX-Credence Fusion LX is a test system in the Test & Probe category.
The LTX / Credence Fusion HF is a tester.
The LTX/Credence Kalos HEX Tester is a semiconductor tester.
The LTX / Credence ASL 3000 is a semiconductor tester with a computer configuration including a Pentium 4 processor, 1GB RAM, 80GB HDD, and Windows NT 4.0 operating system.
The LTX-Credence Kalos 2 HEX is a Test & Probe tool family entry with one documented model, the Kalos 2 HEX Tester.
The LTX-Credence Quartet is a mixed-signal tester used for semiconductor testing.
The Ismeca NY20 is a 20-position turret platform for semiconductor test, inspection, and packaging.
The Ismeca NY32 is a 32-position turret platform for semiconductor test, inspection and packaging.
The Ismeca NY32W is a 32-position turret platform for semiconductors on film-frame wafer media.
The LTX-Credence Sapphire is a semiconductor test and probe system.
The LTX / Credence PAX is a tester with listed modules including SSBA, OVI, HCOVI, AWG_HSB, DIG_HB, DDP_PIN, DDP_SEQ, and XRF.
The LTX-Credence Fusion HFT is a configurable semiconductor tester used for device testing in production and NPI development.
The LTX / Credence PE 3000 is a tester for integrated circuit process manufacturing.
The Kalos HEX Memory is a memory tester manufactured by LTX-Credence.
The LTX / Credence ASL 1000 is an integrated-circuit tester commonly configured with an Electroglas EG 4090 prober for 8-inch wafers.
The LTX / Credence PAXac is a tester with several listed modules or channels.
General referenceThe LTX-Credence TMT ASL 1000 165 is a semiconductor automated test system used in the test and probe segment of integrated-circuit manufacturing for verifying device electrical behavior.
General referenceThe LTX-Credence Fusion CX Mixed Signal is a mixed-signal automatic test equipment (ATE) system used for testing integrated circuits that combine analog and digital functions.
The LTX / Credence X-Series MX is a tester configured with Unison 4.2.0 and a PC-X1 tester PC.
The LTX-Credence Kalos is a test and probe semiconductor tester.
The LTX / Credence ASL 1000 is an automatic test equipment system with listed slot and card assignments.
The LTX / Credence MX 40 is a tester with listed digital, high-voltage, timing, and power-supply configurations.
The LTX / Credence X-Series LX 20 ATE is an automatic test equipment system with docking and a manipulator.
The LTX / Credence Fusion Dragonfly is a tester.
The LTX / Credence ASLx is a tester described with keyboard/monitor, instrument adaptor boards for standard ASL-1000 boards, and several specified slots and board configurations.