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Veeco

Nexus IBE350

EtchVeeco Nexus IBE350 family
Research Quality: 60% complete

The Veeco Nexus IBE350 is a broad-beam ion etcher. The Veeco Nexus IBE350 uses a 350 mm argon ion source. The Veeco Nexus IBE350 includes a SIMS system for real-time end-point detection.[1]

Nexus IBE350 — epfl.ch
Fig. 01Nexus IBE350epfl.ch[1]

Power

1.8 MHz[1]

Vacuum

10^-4 mbar[1]

Gas delivery

argon[1]

Optics

Present downstream of grids optics[1]

What it is

The Veeco Nexus IBE350 is a broad-beam ion etcher used for physical sputter etching of materials in semiconductor and microelectronics fabrication.[1]

The system is designed for etching materials that are difficult to process with conventional plasma-based etching, including piezo and ferro electrics, magnetic materials, III-V semiconductors, ohmic metals, and hard mask materials.[1]

How it works

The Nexus IBE350 generates a mono-energetic beam of argon ions using an inductively coupled plasma (ICP) source with a 350 mm diameter quartz vessel and an RF generator operating at 1.8 MHz with a maximum power of 2 kW.[1]

Ion beam extraction and collimation are achieved through a three-grid molybdenum electrostatic optics system. The grids are biased to extract, accelerate, and collimate the ions, while a decelerator grid at ground potential reduces beam divergence and prevents electron back-streaming from the neutralizer.[1]

A plasma bridge neutralizer downstream of the optics emits electrons to prevent space or surface charging of the substrate. A mechanical shutter between the optics and the process chamber allows beam stabilization before etching begins.[1]

A secondary ion mass spectroscopy (SIMS) system collects and analyzes secondary ions ejected from the sample surface, providing real-time end point detection during the etch process.[1]

Where it fits in the process flow

The Nexus IBE350 is employed in process flows where ion beam etching is required, typically after photolithographic patterning and before subsequent deposition or metrology steps. The system processes wafers or substrates mounted on the cooled, rotating fixture.[1]

Because the etch mechanism is purely physical sputtering with no chemical dependence, the IBE350 can be used for materials that are resistant to reactive plasma etch chemistries, such as noble metals, and for processes where anisotropic profiles or low ion damage are critical.[1]

Applications

The system is used for etching piezo and ferro electric materials, magnetic materials, III-V semiconductors (GaAs, InP, GaN, AlN), ohmic metals (Au, Pt, Cu, Ir), and hard mask materials (Ag, TiWN, Ni). The broad energy range from 50 V to 800 V supports processes from low-damage etching to high-rate removal.[1]

The high vacuum capability (base pressure in the 10⁻⁷ mbar range) and the use of pure physical sputtering eliminate chamber contamination and memory effects, making the system suitable for processes requiring high cleanliness and material isolation.[1]

  • Etching piezoelectric materials
  • Etching ferroelectric materials
  • Etching magnetic materials
  • Etching III-V materials such as GaAs, InP, GaN, and AlN
  • Etching ohmic metals such as Au, Pt, Cu, and Ir
  • Etching hard mask materials such as Ag, TiWN, and Ni
  • Angular etch and shape control of complex structures

What do the numbers mean?

Power & electrical11

Ion source
350 mm diameter Argon ion source with RF plasma generator[1]
Accurate?
RF plasma generator frequency
1.8 MHz[1]
Accurate?
RF plasma generator maximum power
2 kW[1]
Accurate?
Energy range
50 V to 800 V[1]
Accurate?
RF generator frequency
1.8 MHz[1]
Accurate?
RF generator power
2 kW maximum[1]
Accurate?
Beam energy range
50 V to 800 V[1]
Accurate?
RF frequency
1.8 MHz[1]
Accurate?
RF power
2 kW maximum[1]
Accurate?
Ion energy range
50 V to 800 V[1]
Accurate?
Ion source type
ICP source, 350mm diameter, RF plasma generator, 1.8MHz, 2kW maximum[1]
Accurate?

Vacuum & pumping4

Operating pressure
10^-4 mbar[1]
Accurate?
Base pressure
10^-7 mbar[1]
Accurate?
Base pressure
10⁻⁷ mbar[1]
Accurate?
Operating pressure
10⁻⁴ mbar[1]
Accurate?

Wafer handling8

Substrate temperature
Less than 90 °C[1]
Accurate?
Substrate rotation
Up to 10 rpm[1]
Accurate?
Substrate tilt angle
+90° to -70°[1]
Accurate?
Substrate fixture temperature
Less than 90 °C (Veeco FlowCool)[1]
Accurate?
Substrate rotation speed
Up to 10 rpm[1]
Accurate?
Substrate tilt angle range
+90° to -70° with ±0.5° accuracy[1]
Accurate?
Substrate fixture temperature
Less than 90°C[1]
Accurate?
Substrate tilt angle range
+90° to -70°[1]
Accurate?

Gas & chemistry1

Process gas
argon[1]
Accurate?

Optics & imaging8

Ion optics
Three-grids collimation optics system with molybdenum electrostatic apertures[1]
Accurate?
Charge neutralizer
Electron-emitting neutralizer downstream from the ion optics[1]
Accurate?
Ion optics
Three-grids collimation optics (molybdenum)[1]
Accurate?
Mechanical shutter
Present downstream of grids optics[1]
Accurate?
Collimation optics
Three-grids collimation optics system[1]
Accurate?
Charge neutralization
Plasma Bridge Neutralizer downstream from the ion optics[1]
Accurate?
Grid system
Three-grids collimation optics system (molybdenum electrostatic apertures)[1]
Accurate?
Beam collimation optics
three-grids collimation optics system[1]
Accurate?

Control & software2

Tilt angle control
±0.5°[1]
Accurate?
Fixture tilt control
Accurate control +/-0.5°[1]
Accurate?

Dimensions & facilities1

Ion beam width
350 mm[1]
Accurate?

Configuration & options17

Etch type
Broad-beam ion etcher[1]
Accurate?
Endpoint detection
Secondary Ions Mass Spectroscopy (SIMS) system[1]
Accurate?
Process type
Ion beam etching (physical sputtering)[1]
Accurate?
Ion source
Inductively Coupled Plasma (ICP), 350mm diameter[1]
Accurate?
Charge neutralizer
Plasma Bridge Neutralizer (PBN)[1]
Accurate?
Endpoint detection
Secondary Ion Mass Spectroscopy (SIMS) – quadrupole mass analyzer[1]
Accurate?
Tool type
Broad-beam ion etcher[1]
Accurate?
Ion beam diameter
350 mm[1]
Accurate?
Fixture rotation speed
Up to 10 rpm[1]
Accurate?
Fixture tilt range
+90° to -70°[1]
Accurate?
Endpoint detection
SIMS system with quadrupole mass analyser and electron multiplier[1]
Accurate?
Neutralizer type
Plasma Bridge Neutralizer (PBN)[1]
Accurate?
Cooling system
Veeco patented flowcool system[1]
Accurate?
Ion source
350 mm diameter ICP source[1]
Accurate?
Charge neutralization
plasma bridge neutralizer[1]
Accurate?
Fixture tilt angle
+90° to -70°[1]
Accurate?
SIMS endpoint detection
included[1]
Accurate?
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What does it need to run?

Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.

  • Ion source350 mm diameter Argon ion source with RF plasma generator[1]
  • RF plasma generator frequency1.8 MHz[1]
  • RF plasma generator maximum power2 kW[1]
  • Energy range50 V to 800 V[1]
  • Operating pressure10^-4 mbar[1]
  • Base pressure10^-7 mbar[1]
  • RF generator frequency1.8 MHz[1]
  • RF generator power2 kW maximum[1]
  • Beam energy range50 V to 800 V[1]
  • Base pressure10⁻⁷ mbar[1]
  • Operating pressure10⁻⁴ mbar[1]
  • RF frequency1.8 MHz[1]
  • RF power2 kW maximum[1]
  • Ion energy range50 V to 800 V[1]
  • Ion source typeICP source, 350mm diameter, RF plasma generator, 1.8MHz, 2kW maximum[1]
  • Process gasargon[1]

Where are the manuals?

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Not publicly documented

Field notes

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Frequently asked questions

What type of ion source does the Nexus IBE350 use?

The Nexus IBE350 uses an inductively coupled plasma (ICP) source with a 350 mm diameter argon ion source.[1]

What is the beam energy range of the tool?

The beam energy can be set from 50 V to 800 V.[1]

What is the maximum substrate temperature during etching?

The substrate fixture is kept at temperatures below 90 °C.[1]

What tilt angle range is supported?

The tilt angle can be adjusted from +90° to -70°.[1]

Not publicly documented

The following facts about the Nexus IBE350 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.

  • No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the Nexus IBE350 are on record.

    Answerable by: OEM historical records or a trade-press announcement

  • No publicly documented variants, configuration options, or revision breakpoints of the Nexus IBE350 are on record.

    Answerable by: an OEM product catalog or an engineer who ordered or specified the tool

  • The control-system platform and OS era of the Nexus IBE350 are not on record.

    Answerable by: an engineer who operated it or OEM installation records

  • No publicly documented failure modes or field errata for the Nexus IBE350 are on record.

    Answerable by: a field service engineer, process engineer, or maintenance technician

  • The process node or technology generation of the Nexus IBE350 is not on record.

    Answerable by: an OEM datasheet or a fab qualification report

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Sources & citations

Sources (1)Every fact above is drawn from these public sources
  1. [1]epfl.ch — epfl.chepfl.ch
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Last updated Oct 8, 2026.

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